TEMIC Desktop SEM & Accesories
TEMIC EARTH
Model:
• The desktop scanning electron microscope in the MIS series is a structural measurement/material analysis instrument designed for rapid detection of multiple sample types
• Small size, low factory requirements, quick sample change, simple operation
• Recommended industries: micro-nano materials, precision manufacturing, electronic components, integrated circuit packaging
Product specification
• Lanthanum hexaboride (LaB6) single crystal electron gun, high resolution and long life
• Standard BSD/SED dual detector, optional STEM scanning penetration detector
• Unique direct liquid detection kit, which can analyze particle composition/size
• Small size, low factory requirements, quick sample change, simple operation
• Recommended industries: micro-nano materials, precision manufacturing, electronic components, integrated circuit packaging
Product specification
• Lanthanum hexaboride (LaB6) single crystal electron gun, high resolution and long life
• Standard BSD/SED dual detector, optional STEM scanning penetration detector
• Unique direct liquid detection kit, which can analyze particle composition/size
Observation on the surface of magnetic powder synthetic sphere
Zinc oxide nanowire observation measurement
Glass fiber cross section observation measurement (not gold plated)
