TEMIC Desktop SEM & Accesories
TEMIC MARS
Model:
• The custom-made object inspection system in the MIS series is a defect inspection and abnormal component analysis instrument developed specifically for larger components that are not allowed to be destroyed.
• Semiconductor component defect and abnormal particle analysis solution
• The object to be tested is free of fragments, can be customized to the stage and fixture, and can be upgraded to automatic analysis and testing
• Recommended industries: semiconductor key components, chip packaging, high-tech equipment factory
• Taiwan Boutique 2021
Product specification
• Customized clamping fixtures and drive stage, according to the appearance structure of the object, with unique technology to achieve continuous 360-degree surface inspection
• Standard high-precision piezoelectric ceramic motor sample moving stage, upgradeable closed-loop system to achieve precise positioning, customizable coordinate conversion system to import defect list
• Particle Sampling Kits (PSK®), an innovative solution for sampling/shooting/analysis, to assist in particle control/cleanliness abnormality elimination
• Semiconductor component defect and abnormal particle analysis solution
• The object to be tested is free of fragments, can be customized to the stage and fixture, and can be upgraded to automatic analysis and testing
• Recommended industries: semiconductor key components, chip packaging, high-tech equipment factory
• Taiwan Boutique 2021
Product specification
• Customized clamping fixtures and drive stage, according to the appearance structure of the object, with unique technology to achieve continuous 360-degree surface inspection
• Standard high-precision piezoelectric ceramic motor sample moving stage, upgradeable closed-loop system to achieve precise positioning, customizable coordinate conversion system to import defect list
• Particle Sampling Kits (PSK®), an innovative solution for sampling/shooting/analysis, to assist in particle control/cleanliness abnormality elimination