PCB > Equipment > Focus Ion Beam Microscope
Focus Ion Beam Microscope
XVision 300
FIB-SEM Hybrid System 
Based on the high performance automation platform of Hitachi High-Tech ScienceLs SMI3000 series, this new product is equipped with the Hitachi High-Tech Sciences latest FIB column and high performance FE-SEM, achieving highly precise processing with less damage compared with conventional models, and 3nm SEM resolution. 

XVision 200
FIB-SEM Hybrid System
FIB-SEM hybrid system equipped with Hitachi High-Tech Sciences latest FIB column and high performance FE-SEM, and FIB-SEM-Ar Triple Beam system equipped with ultra low kV Ar column which can handle the small sample to 200mm wafer deliver such as high quality TEM sample preparation, Cut&See realtime high resolution obervation and 3D analysis, and EDS analysis. 
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