Solar/Opti-electric/Energy > Equipment > XRF Fluorescent Coating Thickness Gauge > Hitachi High-Tech Science > FT9500 Series Fluorescent X-ray Coating Thickness Gauge

     
Name:   Fluorescent X-ray Coating Thickness Gauge
     
Type:   FT9500 Series
     
Overviews:   Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, FT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to in sufficient fluorescent X-ray intensity from measurement samples.
     
Features:   1. Ultra Thin Film and Multilayered Film Measurement
Poly capillary, X-ray focusing optics system, enables micro beam size of less than 0.1mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, FT9500 series has a capability of quantitative measurement of single nano meter of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layer sin multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.

2.Mapping
Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.

3. Hazardous Substance Analysis (for RoHS and ELV compliance)
FT9500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector liquid nitrogen free is able to detect microelements. Examples are Pb in Pb-free solder and electoless Nickel that are typical component in Electric, Electronics, and Auto products.

4. Particle Analysis
High intensity micro beam combined with high count rate detector makes possible of particle analysis. CCD camera can specify particles, and then subtraction spectrum display functions the qualitative analysis of the particles.

5. Data Editing Function
MS-EXCEL® is equipped with statistical processing function that compiles measurement data as STDEV, Mean, Max, Min, CV, and Cpk. MS-WORD® provides detailed measurement reports with the sample image
     
Specifications
     
Elements Measured:   Atomic Numbers 13(Al) to 83(Bi) 
     
X-Ray Tube:   Tube Voltage : 50kV, Current : 1mA
     
Detector:   Semiconductor Detector (Liquid Nitrogen Free)
     
X-Ray Focusing Optics System:   Capillary
     
X-Ray Beam Size:   0.1mm
     
Sample Observation :   CCD Camera (With zoom)
     
Focus :   Laser Pointer
     
Filter :   Primary Filters
     
X-Ray Station :   Desktop Personal Computer(OS:MS-Windows XP)® , 19&rdquoLCD Monitor
     
Coating Thickness Software :   Film Analysis FP Method (Max 5 Layer Coating, 10 Elements)
Calibration Curve Method (Single & Double Layer, Composition of Alloy Foils)
     
Quantitative Analysis :   Bulk FP
     
Options :   Mapping Software, Judgment Software for Hazardous Substance, Spectrum Matching Software, Image Processing
     
Measurement Function :   Automatic Measurement, Canter Searching
     
Data Processing :   MS-EXCEL®, MS-WORD® installed
     
Report Safety :   Interlocking Sample Door, Sample Collision Prevention Mechanism (crash protection), Diagnostic Function
     

     
Name:   Fluorescent X-ray Coating Thickness Gauge
     
Type:   FT9500
     
Overview:   Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, FT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to in sufficient fluorescent X-ray intensity from measurement samples.
     
Features:   1. Ultra Thin Film and Multilayered Film Measurement Poly capillary, X-ray focusing optics system, enables micro beam size of less than 0.1mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, FT9500 series has a capability of quantitative measurement of single nano meter of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layer sin multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.

2. Mapping Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.

3. Hazardous Substance Analysis (for RoHS and ELV compliance) SFT9500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector liquid nitrogen free is able to detect microelements. Examples are Pb in Pb-free solder and electoless Nickel that are typical component in Electric, Electronics, and Auto products.

4. Particle Analysis High intensity micro beam combined with high count rate detector makes possible of particle analysis. CCD camera can specify particles, and then subtraction spectrum display functions the qualitative analysis of the particles.

5. Data Editing Function MS-EXCELR is equipped with statistical processing function that compiles measurement data as STDEV, Mean, Max, Min, CV, and Cpk. MS-WORDR provides detailed measurement reports with the sample image.

     
Specifications
     
Elements Measured:   Atomic Numbers 13(Al) to 83(Bi)
     
X-Ray Tube:   Tube Voltage : 50kV, Current : 1mA
     
Detector:   Semiconductor Detector (Liquid Nitrogen Free)
     
X-Ray Focusing Optics System:   Capillary
     
X-Ray Beam Size:   0.1mmf
     
Sample Observation :   CCD Camera (With zoom)
     
Focus :   Laser Pointer
     
Filter :   Primary Filters
     
X-Ray Station :   Desktop Personal Computer(OS:MS-Windows XP)R , 19"LCD Monitor
     
Coating Thickness Software :   Film Analysis FP Method (Max 5 Layer Coating, 10 Elements)
Calibration Curve Method (Single & Double Layer, Composition of Alloy Foils)
     
Quantitative Analysis :   Bulk FP
     
Options :   Mapping Software, Judgment Software for Hazardous Substance, Spectrum Matching Software, Image Processing
     
Measurement Function :   Automatic Measurement, Canter Searching
     
Data Processing :   MS-EXCELR, MS-WORDR installed
     
Report Safety :   Interlocking Sample Door, Sample Collision Prevention Mechanism (crash protection), Diagnostic Function
     
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