Name

High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge 

Type

FT150 Series

Overview

The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex&trade silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives excellent operability.

Features

 

1. High precision measurement at micro spots:
The FT150, having a irradiation spot size of 30µm (FWHM:17µm), achieved a fluorescent X-ray intensity twice that of the conventional instrument, FT9500X. For typical application, measurement time to obtain same precision is reduced by half.

2. Product lineup for various applications:
Select the instrument suitable for your samples.
&bullFor measuring an ultra thin film and micro spots of electronic    
  components.
&bullFor measuring a large printed circuit boards of 600mm x 600mm.
&bullFor simultaneous measurement Sn/Ni coating.

3. Safe and easy to use:
The newly designed door with a wide opening width let you set the sample very easily. The closed housing minimizes the risk of X-ray leakage.

4. Enhanced visibility of measurement spots:
A large observation window and optimized parts arrangement improved visibility of the measurement position while the chamber door is closed.

5. Clear sample image:
The higher-resolution sample observation camera with a fully digital zoom provides the clear image of the sample having several tens of micrometers in diameter at a desired observation position. Lighting unit for sample observation adopting LED does not require lamp replacement.

6. New graphical user interfaces:
User setting of measurement methods and samples can be registered as an application icon. Any image such as a sample picture and an illustration of the multilayer can be used for icon image. Measurement recipie can be ed quickly and easily.


SPECIFICATIONS

Type

FT150

FT150h

FT150L

Elements

Atomic No. 13Al) to 92U

X-ray source

Tube voltage: 45kV

Mo target

target

Mo target

Detector

SDD detector No LN2 required)

X-ray focusing optics system

Polycapillary

Sample observation

CCD camera1 million pixels

Focus adjustment

Laser focus, auto focus

Maximum sample size

400W) x 300D) x 100H) mm

400W) x 300D) x 100H) mm

600W) x 600D) x 20H) mm

行程尺寸

400(W)×300(D)mm

400(W)×300(D)mm

300(W)×300(D)mm

Controller

Personal computer with 22 inch LCD Monitor

Measurement software

Thin film FP (Max 5 layers, 10 elements) , Thin film Calibration curve method, Qualitative analysis

Data process

Microsoft Excel, Microsoft Word

Safety functions

Interlocked chamber door

Power consumption

Less than 300VA

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Main Office Location Taiwan - Hsinchu, Tainan / China - Shanghai, Changan
Addresso.No.46, Sianjheng 5th St., Jhubei City, Hsinchu County 302, Taiwan (R.O.C.)|Tel:+886-3-6560883|Fax: +886-3-6564486