KD Thickness Gauge Measurement Tools
Karl Deutch LEPTOSKOP 2042
Model:
LEPTOSKOP 2042 uses the electromagnetic induction method (DIN EN ISO 2178) to measure the thickness of the non-ferromagnetic layer on the ferromagnetic substrate and the eddy current method (DIN EN ISO 2360) to measure the thickness of the non-conductive layer on the non-ferromagnetic material.
●Basic type Provides effective basic measurement functions
●Advanced type Additional statistical evaluation analysis
●Professional statistical evaluation and data storage
Multiple style probes to choose from
●Basic type Provides effective basic measurement functions
●Advanced type Additional statistical evaluation analysis
●Professional statistical evaluation and data storage
Multiple style probes to choose from