Hitachi Coating Thickness Gauge
Hitachi SFT150
Model:
| Name | High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge |
| Type | FT150 Series |
| Overview | The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex&trade silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives excellent operability. |
| Features |
1. High precision measurement at micro spots: The FT150, having a irradiation spot size of 30µm (FWHM:17µm), achieved a fluorescent X-ray intensity twice that of the conventional instrument, FT9500X. For typical application, measurement time to obtain same precision is reduced by half. 2. Product lineup for various applications: Select the instrument suitable for your samples. &bullFor measuring an ultra thin film and micro spots of electronic components. &bullFor measuring a large printed circuit boards of 600mm x 600mm. &bullFor simultaneous measurement Sn/Ni coating. 3. Safe and easy to use: The newly designed door with a wide opening width let you set the sample very easily. The closed housing minimizes the risk of X-ray leakage. 4. Enhanced visibility of measurement spots: A large observation window and optimized parts arrangement improved visibility of the measurement position while the chamber door is closed. 5. Clear sample image: The higher-resolution sample observation camera with a fully digital zoom provides the clear image of the sample having several tens of micrometers in diameter at a desired observation position. Lighting unit for sample observation adopting LED does not require lamp replacement. 6. New graphical user interfaces: User setting of measurement methods and samples can be registered as an application icon. Any image such as a sample picture and an illustration of the multilayer can be used for icon image. Measurement recipie can be ed quickly and easily. |