Fastmicro cleanliness control
Sample Scanner
Model:
Fastmicro Sample Scanner
Surface Cleanliness Validation
Particle Count, Size, Position in Seconds
Product Overview
The Fastmicro Sample Scanner measures surface particle contamination levels indirectly using samplers. These samplers enable users to take surface particle samples at any time on various products and assemblies.
Indirect Measurements with Sampler Holder
The combination of scanner and sampler allows robust measurements in places that are difficult to reach, and on relatively rough surfaces. The samplers collect particles from the surface without causing cross-contamination.
Key Benefits
Workflow Efficiency
The Fastmicro Sample Scanner measures samplers within seconds, enabling an operator workflow of less than one minute. Samplers can be transported in a clean sampler holder, re-measured, and further analyzed.
Surface Cleanliness Validation
Particle Count, Size, Position in Seconds
Product Overview
The Fastmicro Sample Scanner measures surface particle contamination levels indirectly using samplers. These samplers enable users to take surface particle samples at any time on various products and assemblies.
Indirect Measurements with Sampler Holder
The combination of scanner and sampler allows robust measurements in places that are difficult to reach, and on relatively rough surfaces. The samplers collect particles from the surface without causing cross-contamination.
Key Benefits
- Fast: measurements in seconds
- Quantified: objective digital output
- Easy to operate (operator independent):
- Qualification in production by operators
- Analysis for advanced users in R&D
- Monitoring, quick validation, and SPC
- Accurate: reliable measurements (particle count, position, size)
- Consistent: reproducible measurements, time after time
- High throughput: on-the-spot processing
Workflow Efficiency
The Fastmicro Sample Scanner measures samplers within seconds, enabling an operator workflow of less than one minute. Samplers can be transported in a clean sampler holder, re-measured, and further analyzed.
