ISP CO., LTD XRF
iEDX-150WT
Model:
| Item | Details |
|---|---|
| X-ray tube | Mo/Rh/W/Ag Target(Option), 50kVp, 1mA |
| Detection System | Si-Pin Diode (Option : SDD, FSDD) |
| Energy Resolution | Si-Pin Diode : 149eV FWHM at Mn Kα / Option : SDD(125eV), FSDD(122eV) |
| Collimator | 0.3 Collimator (Option : 0.05, 0.1, 0.2, 0.3, 1mm)
Manual / Auto Changing Stage |
| Detection Element | Ti(22)~U(92) |
| Sample Type | Multi-Layer, Wide PCB |
| Moving distance | 200mm X 250mm X 14mm / 500mm X 500mm X 14mm |
| Stage size | 473mm X 525mm / 520mm X 520mm |
| Key Features |
Auto / Manual Stage Mode Plating thickness measurement : General, Rh, Pd, Au, Ag, Sn, Ni Film thickness measurement of multilayer thin films (up to 5 Layer) |
| Camera Magnification | 40~80 x |
| Safety | 3 point interlock |
| Type of Report |
Excel, PDF / output Custom form |
| Key Benefits |
Film thickness measurement of multilayer thin films (up to 5 Layer) Convenient stage control Multi-point measurement possible RoHS Screening (Option) Remote Support by Online |
| Application |
Product screening international environmental regulations(RoHS, WEEE, ELV compliant) Hazardous material(Cr, Br, Cd, Hg, Pb, Cl, Sb, Sn, S) Screening equipment Plating analysis automobile parts, Electronic circuit board(PCB), Such as a capacitor Analysis of single-layer, Multi-layer, Alloy plating Thickness with Composition Ratio can be measure on time in alloy plating |